Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model

• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 1649–1663, doi:10.3762/bjnano.5.176

• ; frequency modulation; multi-frequency atomic force microscopy; viscoelasticity; standard linear solid; Introduction Atomic force microscopy (AFM) has developed considerably since its introduction in the mid-1980s, and today constitutes one of the most powerful and versatile tools in nanotechnology [1][2][3

• and bimodal tip–sample interactions, including force trajectories and discussions on the key observables, after which a brief discussion and a conclusions section are offered. Finally, a short section describing the simulation methods is provided. Background Multi-frequency atomic force microscopy

Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air

• Santiago D. Solares,
• Sangmin An and
• Christian J. Long

Beilstein J. Nanotechnol. 2014, 5, 1637–1648, doi:10.3762/bjnano.5.175

• future research opportunities. Keywords: amplitude-modulation; bimodal; frequency-modulation; multi-frequency atomic force microscopy; multimodal; open loop; trimodal; Introduction Multi-frequency atomic force microscopy (AFM) refers to a family of techniques in which the microcantilever probe is